ALEXANDRIA, Va., June 17 -- United States Patent no. 12,314,646, issued on May 27, was assigned to JPMORGAN CHASE BANK N.A. (New York).
"Systems and methods for identifying and remediating architecture design defects" was invented by Ryan Eavy (Chicago) and Olisa Obinna Okpoko (Brighton, Mich.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for identifying and remediating architecture design defects are disclosed. In one aspect, a method includes generating a new architecture graph pattern based on an architecture design document of an evaluated architecture; determining a model graph pattern, wherein a shape of the model graph pattern is similar to a shape of the architecture graph patter...