US Patent Issued to JOEL on Sept. 30 for "Scanning electron microscope and map display method for absorption edge structure" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,442, issued on Sept. 30, was assigned to JOEL Ltd. (Tokyo).

"Scanning electron microscope and map display method for absorption edge structure" was invented by Hideyuki Takahashi (Tokyo) and Takaomi Yokoyama (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electron beam accelerated using a first acceleration voltage is applied to respective positions on a sample to obtain spectra A at the respective positions, and an electron beam accelerated using a second acceleration voltage different from the first acceleration voltage is applied to the respective positions on the sample to obtain spectra B at the respective positions. Then, a spectral ...