US Patent Issued to JIDOKA TECHNOLOGIES on Oct. 7 for "Anomaly detection using a convolutional neural network and feature based memories" (Indian Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,437,523, issued on Oct. 7, was assigned to JIDOKA TECHNOLOGIES PRIVATE Ltd. (Chennai, India).

"Anomaly detection using a convolutional neural network and feature based memories" was invented by Sekar Udayamurthy (Chennai, India), Mohan Nikam (Chennai, India), Vinodh Venkatesh (Chennai, India) and Krishna Iyengar (Chennai, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present disclosure discuss a system and a method for anomaly detection in an object. Conventional systems of defect detection require labeled training data. Further, current anomaly detection systems cannot be easily incorporated into factory production systems. Emb...