US Patent Issued to Jiangsu Dualix Spectral Imaging Technology on Aug. 5 for "Broad-spectrum imaging spectrometer based on transmission and reflection integrated structure" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,247, issued on Aug. 5, was assigned to Jiangsu Dualix Spectral Imaging Technology Co. Ltd. (Wuxi, China).

"Broad-spectrum imaging spectrometer based on transmission and reflection integrated structure" was invented by Xinghai Chen (Wuxi, China), Yelin Liu (Wuxi, China), Yanqiu Zhou (Wuxi, China) and Fei Tong (Wuxi, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a broad-spectrum imaging spectrometer based on reflection and transmission integrated structure, including a coaxial reflection outer cylinder and a coaxial transmission outer cylinder. A slit component is provided at an incident end of the coaxial reflection outer cylinder;...