US Patent Issued to JEOL on Sept. 30 for "Specimen machining device and specimen machining method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,333, issued on Sept. 30, was assigned to JEOL Ltd. (Tokyo).

"Specimen machining device and specimen machining method" was invented by Tatsuhito Kimura (Tokyo), Munehiro Kozuka (Tokyo) and Naoki Sugano (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A specimen machining device includes an illumination system that illuminates a specimen; a camera that photographs the specimen; and a processing unit that controls the illumination system and the camera, and acquires a machining control image which is used for controlling an ion source and a display image which is displayed on a display unit. The processing unit controls the illumination system to...