ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,431,328, issued on Sept. 30, was assigned to JEOL Ltd. (Tokyo).
"Electron microscope and calibration method" was invented by Yuji Konyuba (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An electron microscope includes an electronic optical system that irradiates a specimen with an electron beam and forms an image; a camera that includes an image sensor and outputs a frame image; and a computation unit that generates an image based on the frame image. The computation unit sets a threshold; and binarizes the frame image using the threshold, and generates the image based on the binarized frame image. In setting the threshold, the computation unit re...