US Patent Issued to JEOL on Sept. 30 for "Charged particle beam device and image generation method" (Japanese, American Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,431,319, issued on Sept. 30, was assigned to JEOL Ltd. (Tokyo).

"Charged particle beam device and image generation method" was invented by Hiroki Hashiguchi (Tokyo), Kazuki Yagi (Tokyo), Ruth Shewmon Bloom (Oakland, Calif.) and Bryan W. Reed (San Leandro, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A charged particle beam device scans a specimen with a charged particle beam and generates an image based on a detected signal from a detector that detects a signal generated from the specimen based on the scan performed by the charged particle beam. The charged particle beam device includes: a blanker that performs blanking of the charged particle...