US Patent Issued to JEOL on Sept. 30 for "Charged particle beam device and image acquisition method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,431,326, issued on Sept. 30, was assigned to JEOL Ltd. (Tokyo).

"Charged particle beam device and image acquisition method" was invented by Nobuyuki Ikeo (Tokyo) and Kenichi Tsutsumi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A charged particle beam device acquires an image by scanning a specimen with a probe formed from a charged particle beam and detects a signal emitted from the specimen. The charged particle beam device includes an optical system that forms the probe; a control unit that repeatedly performs correction processing and image acquisition processing for acquiring a frame image; and an image processing unit that generates an i...