ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,120, issued on Oct. 7, was assigned to JEOL Ltd. (Tokyo).
"Sample container and measuring method" was invented by Genki Kinugasa (Tokyo) and Kotaro Asami (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a sample container which is for use with an X-ray fluorescence analyzer and which permits measurement of light elements in a liquid. The sample container includes a sealable first receptacle, a pressure adjusting valve for adjusting the pressure in the first receptacle, a second receptacle receiving a liquid sample (S) and having both a first opening and a second opening located inside and outside, respectively, of the first receptacl...