ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,476,071, issued on Nov. 18, was assigned to JEOL Ltd. (Tokyo).
"Specimen machining device and specimen machining method" was invented by Munehiro Kozuka (Tokyo), Tsutomu Negishi (Tokyo), Tatsuhito Kimura (Tokyo), Yoshikazu Ishikawa (Tokyo) and Hisashi Kawahara (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A specimen machining device for machining a specimen by irradiating the specimen with an ion beam includes an ion source for irradiating the specimen with the ion beam, a shielding member disposed on the specimen to block the ion beam, a specimen stage for holding the specimen, a camera for photographing the specimen, a coaxial illumination dev...