ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,476,095, issued on Nov. 18, was assigned to JEOL Ltd. (Tokyo).
"Sample analyzing apparatus and method" was invented by Ayumi Kubo (Tokyo), Masaaki Ubukata (Tokyo) and Kenji Nagatomo (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A first searcher executes a primary search with respect to a primary library based on a sample mass spectrum. The primary library includes a plurality of standard mass spectra. When a judging unit judges that a search range is to be enlarged, a second searcher executes a secondary search with respect to a secondary library based on the sample mass spectrum. The secondary library includes a plurality of predicted mass spec...