ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,675, issued on Nov. 11, was assigned to JEOL Ltd. (Tokyo).
"Phase analyzer, sample analyzer, and analysis method" was invented by Yuka Otake (Tokyo) and Atsuhiro Fujii (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A phase analyzer includes a data acquisition unit that acquires spectrum imaging data in which a position on a sample is associated with a spectrum of a signal from the sample; a phase analysis unit that performs phase analysis based on the spectrum imaging data; a display control unit that displays results of the phase analysis on a first screen; and a condition reception unit that receives an operation for changing a condition fo...