ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,888, issued on Nov. 11, was assigned to JEOL Ltd. (Tokyo).
"Phase analyzer, sample analyzer, and analysis method" was invented by Kouta Itoh (Tokyo), Atsuhiro Fujii (Tokyo) and Yuka Otake (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A phase analyzer includes a data acquisition unit that acquires spectrum imaging data in which a position on a sample is associated with a spectrum of a signal from the sample; a candidate determination unit that performs multivariate analysis on the spectrum imaging data to determine candidates for the number of phases; a phase analysis unit that creates, for each of the candidates, a phase map group including ...