ALEXANDRIA, Va., March 26 -- United States Patent no. 12,261,014, issued on March 25, was assigned to JEOL Ltd. (Tokyo).
"Scanning electron microscope and objective lens" was invented by Motohiro Nakamura (Tokyo) and Takeyuki Kobayashi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a scanning electron microscope which has a sample chamber capable of being evacuated to a low vacuum. The scanning electron microscope includes an electron gun for emitting an electron beam, an objective lens for focusing the emitted beam onto a sample, and a sample chamber in which the sample is housed. The objective lens includes an inner polepiece, an outer polepiece disposed outside the inner polepiece...