US Patent Issued to JEOL on July 15 for "Charged particle beam apparatus and image adjustment method" (Japanese Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,362,134, issued on July 15, was assigned to JEOL Ltd. (Tokyo).

"Charged particle beam apparatus and image adjustment method" was invented by Tomohiro Mihira (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a charged particle beam apparatus that acquires an image by scanning a specimen with a charged particle beam, and includes a contrast adjustment circuit that adjusts contrast of the image; a brightness adjustment circuit that adjusts brightness of the image; and a control unit that controls the contrast adjustment circuit and the brightness adjustment circuit. The control unit acquires information on luminance of a reference image in ...