ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,269, issued on Dec. 16, was assigned to JEOL Ltd. (Tokyo).
"Phase analyzer, sample analyzer, and analysis method" was invented by Atsuhiro Fujii (Tokyo), Kouta Itoh (Tokyo) and Yuka Otake (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A phase analyzer includes a data acquisition unit that acquires a plurality of pieces of spectrum imaging data in which positions on a sample are associated with spectra which are based on signals from the sample; a first acquisition unit that acquires a first representative spectrum group for each piece of spectrum imaging data by performing multivariate analysis on each of the plurality of pieces of spectrum i...