ALEXANDRIA, Va., June 5 -- United States Patent no. 12,278,084, issued on April 15, was assigned to JEOL Ltd. (Tokyo).
"Electron microscope and image generation method" was invented by Motohiro Nakamura (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an electron microscope for generating a montage image by acquiring images of a plurality of regions in a montage image capturing region set on a specimen, and by connecting the acquired images. The electron microscope includes a specimen surface height calculating unit that calculates a distribution of specimen surface heights in the montage image capturing region by performing curved surface approximation based on the specimen surface heights ...