US Patent Issued to JENTEK Sensors on Nov. 4 for "System and method for hole inspection and qualification" (Massachusetts, Florida, Pennsylvania Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,068, issued on Nov. 4, was assigned to JENTEK Sensors Inc. (Marlborough, Mass.).

"System and method for hole inspection and qualification" was invented by Stuart Chaplan (Marlborough, Mass.), Neil Goldfine (Cocoa Beach, Fla.) and Zachary M. Thomas (Pittsburgh).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method are provided for performing a hole inspection performance study. Specimens for the performance study are made from a reconfigurable set of inspection plates. Each plate includes multiple test holes which are located symmetrically. The plates may be of various thicknesses and materials. Each test hole may or may not have a feature...