US Patent Issued to JENTEK Sensors on March 18 for "In-process quality assessment for additive manufacturing" (Massachusetts, Florida Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,492, issued on March 18, was assigned to JENTEK Sensors Inc. (Marlborough, Mass.).

"In-process quality assessment for additive manufacturing" was invented by Neil J Goldfine (Cocoa Beach, Fla.) and Todd M Dunford (Amherst, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclose is a system and method for real-time measurement and feedback of metrology and metallurgical data during additive manufacturing (AM) part fabrication. This solution promises to provide higher performance, lower cost AM parts. A sensor is placed either in the rake/roller or following the rake/roller so that it has no impact on the process efficiency and can be used to p...