US Patent Issued to JE INTERNATIONAL on April 22 for "Automatic determination process device, automatic determination process method, inspection system, program, and recording medium" (Japanese Inventor)

ALEXANDRIA, Va., June 6 -- United States Patent no. 12,283,036, issued on April 22, was assigned to JE INTERNATIONAL Corp. (Gifu, Japan).

"Automatic determination process device, automatic determination process method, inspection system, program, and recording medium" was invented by Minsu Kim (Gifu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An automatic determination process device 1 comprises image acquisition units 14, 147, 247, an automatic determination unit 15, and determination result output units 14, 148, 248. An error detection verification device 2 displays a defect candidate image on a display device. The error detection verification device 2 acquires, via an input device, secondary ins...