ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,953, issued on Nov. 11, was assigned to JAPAN ELECTRONIC MATERIALS Corp. (Hyogo, Japan).
"Probe card" was invented by Yuuki Nakamura (Hyogo, Japan), Masatoshi Hasaka (Hyogo, Japan) and Hiroshi Yamanaka (Hyogo, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An object is to provide a probe card for high-temperature inspection at low cost. A wiring board 130 that supports a large number of probes 15, a heat-generating film 3 formed on the wiring board 130, and a pair of electrode terminals 4 that supplies a current to the heat-generating film 3 are provided, and the heat-generating film 3 is formed on a surface of the wiring board 130 by applying...