US Patent Issued to J.A. WOOLLAM on Dec. 16 for "Sample alignment system in reflectometers, ellipsometers, spectrophotometers and the like" (Nebraska Inventor)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,317, issued on Dec. 16, was assigned to J.A. WOOLLAM Co. INC. (Lincoln, Neb.).

"Sample alignment system in reflectometers, ellipsometers, spectrophotometers and the like" was invented by Martin M. Liphardt (Lincoln, Neb.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Sample surface alignment systems and methodology particularly applicable where samples are investigated in environmental chambers."

The patent was filed on March 23, 2024, under Application No. 18/445,912.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool....