US Patent Issued to iSTART-TEK on May 20 for "Configurable testing and repair system for non-volatile memory" (Taiwanese Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,308,081, issued on May 20, was assigned to iSTART-TEK INC. (Zhubei, Taiwan).

"Configurable testing and repair system for non-volatile memory" was invented by Cheng-Yen Han (Zhubei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A configurable testing and repair system for a non-volatile memory includes: a memory testing device capable of carrying a to-be-tested memory performs a test operation on the to-be-tested memory to determine whether or not the to-be-tested memory is a to-be-repaired memory that needs to be repaired, and performs a diagnostic operation on the to-be-repaired memory, so as to generate defect data including a fault address an...