US Patent Issued to ISRA VISION on Nov. 11 for "Method and device for detecting local defects on a reflective surface" (German Inventor)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,872, issued on Nov. 11, was assigned to ISRA VISION GmbH (Darmstadt, Germany).

"Method and device for detecting local defects on a reflective surface" was invented by Klaus Veit (Furth, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting local defects on a reflective surface with a device having at least one pattern for reflection on the reflective surface, at least one camera and a data processing unit. The pattern has at least one substantially linear light-dark transition, the positioning and orientation of the camera are known, the camera captures the pattern reflected on the surface and generates image data of the refl...