ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,438, issued on Sept. 30, was assigned to ISHIDA Co. LTD. (Kyoto, Japan).
"X-ray inspection device" was invented by Ken Iwakawa (Ritto, Japan) and Osamu Hirose (Ritto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray inspection device includes a transport unit, an X-ray irradiation unit configured to irradiate an article with X-rays, an X-ray detection unit configured to detect the X-rays in each of a plurality of energy bands, an X-ray transmission image generation unit configured to generate a plurality of X-ray transmission images on the basis of the X-rays in each of the plurality of energy bands, and an inspection unit configured t...