ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,885, issued on Nov. 11, was assigned to ISHIDA Co. LTD. (Kyoto, Japan).
"X-ray inspection device" was invented by Futoshi Yurugi (Ritto, Japan), Yoshiaki Sakagami (Ritto, Japan), Atsushi Yamakawa (Ritto, Japan) and Kota Tominaga (Ritto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray inspection device includes a conveyor, an X-ray irradiation unit, an X-ray detection unit, an inspection unit configured to inspect an article on the basis of an X-ray transmission image, a housing accommodating the X-ray irradiation unit and the X-ray detection unit, a cool air blower configured to cool air inside the housing and guide cool air to the X-r...