US Patent Issued to ISHIDA on July 1 for "X-ray inspection apparatus and adjustment method thereof" (Japanese Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,343,189, issued on July 1, was assigned to ISHIDA Co. LTD. (Kyoto, Japan).

"X-ray inspection apparatus and adjustment method thereof" was invented by Ken Iwakawa (Ritto, Japan), Futoshi Yurugi (Ritto, Japan) and Keisuke Yoshida (Ritto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray inspection apparatus includes: a transport unit configured to transport an article; an X-ray source configured to irradiate the article with X-rays; an X-ray detection unit configured to detect the X-rays using a photon counting method and to classify photon energy of the detected X-rays into two or more energy regions on the basis of a threshold value; a thresh...