ALEXANDRIA, Va., Feb. 12 -- United States Patent no. 12,222,301, issued on Feb. 11, was assigned to ISHIDA Co. LTD. (Kyoto, Japan).
"X-ray inspection apparatus" was invented by Ken Iwakawa (Ritto, Japan), Akihiro Maenaka (Ritto, Japan) and Futoshi Yurugi (Ritto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray inspection apparatus includes an X-ray source configured to irradiate an article with X-rays in a plurality of energy bands, an X-ray detection unit capable of detecting the X-rays by a photon counting method, an image generation unit configured to generate an overall transmission image corresponding to the X-rays in all of the plurality of energy bands and a transmission image correspondi...