ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,562, issued on Dec. 30, was assigned to Ironwood Electronics Inc. (Eagan, Minn.).

"Test socket with conductive compression contacts for integrated circuits" was invented by Ilavarasan M. Palaniappa (Inver Grove Heights, Minn.) and David A. Struyk (Deephaven, Minn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test socket for an electronic circuit device with protruding circuit contacts, the test socket including an underlying PCB substrate with an overlaying electrically insulative housing, where the PCB substrate includes an array of electrically conductive vias extending therethrough, and the housing includes an array of socket apertures which ...