US Patent Issued to IPG Photonics on March 25 for "Methods and systems for characterizing laser machining properties by measuring keyhole dynamics using interferometry" (Canadian Inventor)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,257,644, issued on March 25, was assigned to IPG Photonics Corp. (Oxford, Mass.).

"Methods and systems for characterizing laser machining properties by measuring keyhole dynamics using interferometry" was invented by Paul J. L. Webster (Kingston, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method, apparatus, and system are provided to monitor and characterize the dynamics of a phase change region (PCR) created during laser welding, specifically keyhole welding, and other material modification processes, using low-coherence interferometry. By directing a measurement beam to multiple locations within and overlapping with the PCR, the system, ...