US Patent Issued to IONQ on Sept. 9 for "Improving quantum gate infidelity in trapped ion quantum computers" (Maryland, California Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,412,112, issued on Sept. 9, was assigned to IONQ INC. (College Park, Md.).

"Improving quantum gate infidelity in trapped ion quantum computers" was invented by Ming Li (Silver Spring, Md.), Kenneth Wright (Berwyn Heights, Md.), Neal C. Pisenti (Laurel, Md.), Kristin Marie Beck (Livermore, Calif.), Jason Hieu Van Nguyen (Hyattsville, Md.) and Yunseong Nam (North Bethesda, Md.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of performing a quantum gate operation in an ion trap quantum computing system includes identifying one or more error mechanisms that cause a quantum computational error in a quantum gate operation on a first trapped ion of an...