ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,472,383, issued on Nov. 18, was assigned to ION BEAM APPLICATIONS (Louvain-la-Neuve, Belgium).
"Device and method for tuning a charged particle beam position" was invented by David Chris Hertlein (Louvain-la-Neuve, Belgium), Francois Vander Stappen (Louvain-la-Neuve, Belgium) and Rudi Labarbe (Louvain-la-Neuve, Belgium).
According to the abstract* released by the U.S. Patent & Trademark Office: "A particle therapy apparatus configured to scan a charged particle beam over a target according to a pre-defined treatment field which covers a treatment surface in an isocenter plane of the apparatus. The apparatus is capable of scanning the beam over a reachable surface which covers and is ...