ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,302, issued on March 25, was assigned to INVENTEC (PUDONG) TECHNOLOGY Corp. (Shanghai) and INVENTEC Corp. (Taipei, Taiwan).
"Test fixture for supporting a device under test" was invented by Hsin Hua Chen (Taipei, Taiwan) and Chun-Ming Lu (Taipei, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test fixture configured to support a DUT (device under test) and including a bottom base, two mounting bases, a rotatable base and a supporting base. The two mounting bases stand on a side of the bottom base and are spaced apart from each other. The rotatable base is rotatably disposed on the two mounting bases. At least a part of the rotatable base i...