US Patent Issued to International Business Machines on Sept. 9 for "Effective metal density screens for hierarchical design rule checking (DRC) analysis" (Texas, New York, Vermont Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,412,020, issued on Sept. 9, was assigned to International Business Machines Corp. (Armonk, N.Y.).

"Effective metal density screens for hierarchical design rule checking (DRC) analysis" was invented by Brian Veraa (Round Rock, Texas), Ryan Michael Kruse (Williamson, Texas), Christopher Gonzalez (Shelburne, Vt.) and David Wolpert (Poughkeepsie, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the invention include systems and methods configured to provide hierarchical circuit designs that makes use of effective metal density screens during hierarchical design rule checking (DRC) analysis. A non-limiting example computer-implemented method i...