ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,868, issued on Sept. 30, was assigned to INTERNATIONAL BUSINESS MACHINES Corp. (Armonk, N.Y.).
"Guided multi-spectral inspection" was invented by Alberto Valdes Garcia (Chappaqua, N.Y.), Ahmet Serkan Ozcan (Los Altos, Calif.), Vincent Albouy (San Francisco), Asaf Tzadok (New Castle, N.Y.), Petar K. Pepeljugoski (Tarrytown, N.Y.) and Jean-Olivier Plouchart (New York).
According to the abstract* released by the U.S. Patent & Trademark Office: "An imaging system is provided. A first imaging system captures initial sensor data in a form of visible domain data. A second imaging system captures subsequent sensor data in a form of second domain data, wherein the initial and subsequent ...