ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,465, issued on Sept. 23, was assigned to International Business Machines Corp. (Armonk, N.Y.).

"In-situ chip design for pulse IV self-heating evaluation" was invented by Huimei Zhou (Albany, N.Y.), Yoo-Mi Lee (Montvale, N.J.), Jingyun Zhang (Albany, N.Y.), Miaomiao Wang (Albany, N.Y.) and Huiming Bu (Glenmont, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An in-situ chip design is provided for self-heating free characterization of a device under test (DUT) with a short time constant. The in-situ chip design includes a pulse generator configured to output a pulse to the DUT and a buffering circuit arranged between the pulse generator and the D...