ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,177, issued on May 20, was assigned to International Business Machines Corp. (Armonk, N.Y.).

"Auto generation of debug trace in pre-silicon verification" was invented by Shailesh Sharma (Uttar Pradesh, India) and Madhusudan Kadiyala (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments are for auto generation of a debug trace in pre-silicon verification. A configuration file is created that includes fail information of a fail related to at least one failed interface of a design. A Boolean expression is generated to represent interface signals of the at least one failed interface, the configuration file comprising the interface...