ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,354, issued on March 18, was assigned to International Business Machines Corp. (Armonk, N.Y.).

"Radio frequency identification based three-dimensional metrology" was invented by Olawunmi Akinlemibola (Lanham, Md.), Jennifer I. Bennett (Rochester, Minn.) and Theron Lee Lewis (Rochester, Minn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for obtaining three-dimension measurements for an object utilizing a population of radio-frequency identification (RFID) chips in a medium includes placing the object into a container with the population of RFID chips in the medium. The method also includes capturing a plurality of coordinates for the popu...