US Patent Issued to International Business Machines on June 24 for "Layer-to-layer registration measurement mark" (Japanese Inventor)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,342,455, issued on June 24, was assigned to International Business Machines Corp. (Armonk, N.Y.).

"Layer-to-layer registration measurement mark" was invented by Hiroyuki Mori (Yasu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of present invention provide a multilayer printed circuit board. The printed circuit board includes a first conducting layer (CL) having a first measurement mark area (MMA) and a second CL having a second MMA. A first polygonal measurement mark (MM) in the first MMA and a second and a third polygonal MM in the second MMA, wherein the second polygonal MM is positioned along an extended first angle bisector bisec...