ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,387,235, issued on Aug. 12, was assigned to International Business Machines Corp. (Armonk, N.Y.).
"Subgroup analysis in A/B testing" was invented by William Ogallo (Nairobi, Kenya), Girmaw Abebe Tadesse (Nairobi, Kenya), Julian Bertram Kuehnert (Nairobi, Kenya) and Skyler Speakman (Nairobi, Kenya).
According to the abstract* released by the U.S. Patent & Trademark Office: "Described are techniques for A/B testing including a computer-implemented method of identifying, in an A/B testing database, a set of feature values with a statistically significant difference in A/B testing outcomes above a threshold. The method further includes partitioning records in the A/B testing database int...