US Patent Issued to Interface Technology (ChengDu), Interface Optoelectronics (ShenZhen), General Interface Solution on Oct. 7 for "Multilayer film measuring device and multilayer film measuring method" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,435,974, issued on Oct. 7, was assigned to Interface Technology (ChengDu) Co. Ltd. (Chengdu, China), Interface Optoelectronics (ShenZhen) Co. Ltd. (Shenzhen, China) and General Interface Solution Ltd. (Miaoli County, Taiwan).

"Multilayer film measuring device and multilayer film measuring method" was invented by Ling-Kuei Hung (Miaoli County, Taiwan), Jiang-Yun Zhou (Miaoli County, Taiwan), Hung-Chuan Mai (Miaoli County, Taiwan) and Sheng-Chun Chuang (Miaoli County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A multilayer film measuring device, which comprises in sequence: a measuring module, a multilayer film to be measured, and a circular pol...