US Patent Issued to Intelligent Memory on June 3 for "Systems and methods for reducing error log required space in semiconductor testing" (California Inventor)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,321,249, issued on June 3, was assigned to Intelligent Memory Ltd. (Kwai Chung, Hong Kong).

"Systems and methods for reducing error log required space in semiconductor testing" was invented by Mike Hossein Amidi (Lake Forest, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory testing device uses a master control unit (MCU) to concurrently operate multiple, intelligent, slave control units (SCUs). The MCU or an SCU translates memory addresses of a device under test (DUT) into a matrix. The SCU accumulates error data by testing a test bit of the memory across multiple cells of the matrix, the accumulated error data is post-processed to determin...