US Patent Issued to Intelligent Memory on July 29 for "Apparatus, systems, and methods for dynamically reconfigured semiconductor tester for volatile and non-volatile memories" (California Inventor)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,374,417, issued on July 29, was assigned to Intelligent Memory Ltd. (Kwai Chung, Hong Kong).

"Apparatus, systems, and methods for dynamically reconfigured semiconductor tester for volatile and non-volatile memories" was invented by Mike Hossein Amidi (Lake Forest, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory testing device uses a master control unit to concurrently operate multiple, intelligent, slave control units (SCUs). SCUs can have one or more processing unit(s) (i.e. Finite State Machines, micro controllers, processors) capable of testing volatile and/or non-volatile memory devices connected into one or more DUT devices. Addition...