US Patent Issued to Intel on Sept. 30 for "Method and system for error check and scrub error data collection and reporting for a memory device" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,203, issued on Sept. 30, was assigned to Intel Corp. (Santa Clara, Calif.).

"Method and system for error check and scrub error data collection and reporting for a memory device" was invented by Yanxin Zhao (Shanghai), Tao Xu (Shanghai), Yufu Li (Shanghai), Shijie Liu (Shanghai) and Lei Zhu (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system for error check and scrub (ECS) error data collection and reporting for a memory device. A controller includes circuitry and a buffer. The circuitry may be configured to read ECS error data from a register of a memory device and calculate an ECS error increase rate based on the ECS error...