ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,747, issued on May 20, was assigned to Intel Corp. (Santa Clara, Calif.).

"In-situ detection of anomalies in integrated circuits using machine learning models" was invented by Sriram R. Vangal (Portland, Ore.), Hyochan An (Ann Arbor, Mich.), Vivek K. De (Beaverton, Ore.), Narayan Srinivasa (San Jose, Calif.), Farzin G. Guilak (Beaverton, Ore.), Miguel Bautista Gabriel (Austin, Texas) and Pratik Dasharathkumar Patel (Hillsboro, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit (IC) is provided for in-situ anomaly detection. Sensors in the IC generates sensor datasets including information indicating conditions in the IC. A pro...