US Patent Issued to Intel on May 20 for "Gate-all-around integrated circuit structures having uniform threshold voltages and tight gate endcap tolerances" (Oregon Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,310,060, issued on May 20, was assigned to Intel Corp. (Santa Clara, Calif.).

"Gate-all-around integrated circuit structures having uniform threshold voltages and tight gate endcap tolerances" was invented by Dan S. Lavric (Beaverton, Ore.), Dax M. Crum (Beaverton, Ore.), David J. Towner (Portland, Ore.), Orb Acton (Portland, Ore.), Jitendra Kumar Jha (Hillsboro, Ore.), YenTing Chiu (Portland, Ore.), Mohit K. Haran (Hillsboro, Ore.), Oleg Golonzka (Beaverton, Ore.) and Tahir Ghani (Portland, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit structure comprises a first and second vertical arrangement of horizontal nanowires in a P...