ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,309, issued on June 17, was assigned to Intel Corp. (Santa Clara, Calif.).
"Built-in self-test for network on chip fabric" was invented by Dawn Maxon (San Jose, Calif.), Eric A. Norige (Santa Clara, Calif.), Joji Philip (San Jose, Calif.), William John Bainbridge (Palo Alto, Calif.) and Joseph B. Rowlands (Alviso, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system comprising a network-on-chip (NOC) fabric comprising a plurality of routes to communicate data between a plurality of agents; a plurality of built-in self-test (BIST) generators, wherein a BIST generator of the plurality of BIST generators is coupled between an agent of the plu...