ALEXANDRIA, Va., July 9 -- United States Patent no. 12,355,231, issued on July 8, was assigned to Intel Corp. (Santa Clara, Calif.).
"Overvoltage and slow clock glitch detection" was invented by Daniel Nemiroff (Folsom, Calif.) and Carlos Tokunaga (Hillsboro, Ore.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus, system, and method for are provided. A device includes a first tunable replica circuit configured to detect an undervoltage and overclocking event, a second tunable replica circuit configured to detect an overvoltage and underclocking event, and a countermeasures component configured to alter a circuit of the device responsive to detection of the undervoltage and overclocking event or the...