US Patent Issued to Intel on July 22 for "Technology to measure latency in hardware with fine-grained transactional filtration" (American, Indian Inventors)

ALEXANDRIA, Va., July 23 -- United States Patent no. 12,367,063, issued on July 22, was assigned to Intel Corp. (Santa Clara, Calif.).

"Technology to measure latency in hardware with fine-grained transactional filtration" was invented by Michael Cole (Folsom, Calif.), Pattabhiraman K (Banglore, India) and Ankita A. Agarwal (Dublin, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems and apparatuses may provide for technology that includes configuration registers to maintain state information, a filter coupled to the configuration registers, the filter to extract transactions of interest from a plurality of incoming transactions based on the state information, wherein the transactions of in...