US Patent Issued to Intel on Aug. 26 for "Optical inspection tool and inspection method for inspecting multifaceted groove specimens" (Arizona Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,135, issued on Aug. 26, was assigned to Intel Corp. (Santa Clara, Calif.).

"Optical inspection tool and inspection method for inspecting multifaceted groove specimens" was invented by Jianyong Mo (Chandler, Ariz.), Fan Fan (Chandler, Ariz.) and Liang Zhang (Chandler, Ariz.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical inspection tool may include at least a first image capture unit and a second image capture unit for inspecting specimens having a substantially V-shaped grooves. The first image capture unit may be arranged in a first orientation so as to be directable towards a first angular surface of the V-shaped groove of each specimen....